Highlighting of two types of defects in 1300 nm PBC laser diodes
Identifieur interne : 001F26 ( Main/Exploration ); précédent : 001F25; suivant : 001F27Highlighting of two types of defects in 1300 nm PBC laser diodes
Auteurs : B. Bauduin [France] ; J. Wallon [France] ; D. Riviere [France] ; J. Y. Boulaire [France]Source :
- Quality and Reliability Engineering International [ 0748-8017 ] ; 1996-07.
English descriptors
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Abstract
Laser diodes of PBC (p‐substrate buried crescent) structure and emitting at 1300 nm, were subjected to calibrated electrostatic discharges (ESD). A failure analysis was then set up using a scanning optical microscope (SOM) and has allowed the localization of the damaged zones. The comparison of the results obtained with the electro‐optical characteristics has highlighted two types of complementary defects: (i) a so‐called optical type defect, since the optical power is significantly reduced, although leakage current has not occurred (active layer seriously damaged); (ii) a so‐called electrical type defect, since the leakage current increases, although the optical power is barely reduced (active layer weakly damaged).
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DOI: 10.1002/(SICI)1099-1638(199607)12:4<317::AID-QRE29>3.0.CO;2-B
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Boulaire</name></author></titleStmt><publicationStmt><idno type="wicri:source">ISTEX</idno><idno type="RBID">ISTEX:D6635E21CA0950CCB890930C00BB3AA1982177C6</idno><date when="1996" year="1996">1996</date><idno type="doi">10.1002/(SICI)1099-1638(199607)12:4<317::AID-QRE29>3.0.CO;2-B</idno><idno type="url">https://api.istex.fr/document/D6635E21CA0950CCB890930C00BB3AA1982177C6/fulltext/pdf</idno><idno type="wicri:Area/Istex/Corpus">000427</idno><idno type="wicri:Area/Istex/Curation">000427</idno><idno type="wicri:Area/Istex/Checkpoint">000E40</idno><idno type="wicri:doubleKey">0748-8017:1996:Bauduin B:highlighting:of:two</idno><idno type="wicri:Area/Main/Merge">001F82</idno><idno type="wicri:Area/Main/Curation">001F26</idno><idno type="wicri:Area/Main/Exploration">001F26</idno></publicationStmt><sourceDesc><biblStruct><analytic><title level="a" type="main" xml:lang="en">Highlighting of two types of defects in 1300 nm PBC laser diodes</title><author><name sortKey="Bauduin, B" sort="Bauduin, B" uniqKey="Bauduin B" first="B." last="Bauduin">B. 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Int.</title><idno type="ISSN">0748-8017</idno><idno type="eISSN">1099-1638</idno><imprint><publisher>Wiley Subscription Services, Inc., A Wiley Company</publisher><pubPlace>Chichester</pubPlace><date type="published" when="1996-07">1996-07</date><biblScope unit="volume">12</biblScope><biblScope unit="issue">4</biblScope><biblScope unit="page" from="317">317</biblScope><biblScope unit="page" to="320">320</biblScope></imprint><idno type="ISSN">0748-8017</idno></series><idno type="istex">D6635E21CA0950CCB890930C00BB3AA1982177C6</idno><idno type="DOI">10.1002/(SICI)1099-1638(199607)12:4<317::AID-QRE29>3.0.CO;2-B</idno><idno type="ArticleID">QRE4680120417</idno></biblStruct></sourceDesc><seriesStmt><idno type="ISSN">0748-8017</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>OBIC</term><term>SOM</term><term>components</term><term>failure analysis</term><term>laser diodes</term><term>optoelectronic devices</term></keywords></textClass><langUsage><language ident="en">en</language></langUsage></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Laser diodes of PBC (p‐substrate buried crescent) structure and emitting at 1300 nm, were subjected to calibrated electrostatic discharges (ESD). A failure analysis was then set up using a scanning optical microscope (SOM) and has allowed the localization of the damaged zones. The comparison of the results obtained with the electro‐optical characteristics has highlighted two types of complementary defects: (i) a so‐called optical type defect, since the optical power is significantly reduced, although leakage current has not occurred (active layer seriously damaged); (ii) a so‐called electrical type defect, since the leakage current increases, although the optical power is barely reduced (active layer weakly damaged).</div></front></TEI><affiliations><list><country><li>France</li></country><region><li>Région Bretagne</li></region><settlement><li>Lannion</li></settlement></list><tree><country name="France"><region name="Région Bretagne"><name sortKey="Bauduin, B" sort="Bauduin, B" uniqKey="Bauduin B" first="B." last="Bauduin">B. Bauduin</name></region><name sortKey="Boulaire, J Y" sort="Boulaire, J Y" uniqKey="Boulaire J" first="J. Y." last="Boulaire">J. Y. Boulaire</name><name sortKey="Riviere, D" sort="Riviere, D" uniqKey="Riviere D" first="D." last="Riviere">D. Riviere</name><name sortKey="Wallon, J" sort="Wallon, J" uniqKey="Wallon J" first="J." last="Wallon">J. Wallon</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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